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C W Tyler, P Apkarian, D M Levi, K Nakayama; Rapid assessment of visual function: an electronic sweep technique for the pattern visual evoked potential.. Invest. Ophthalmol. Vis. Sci. 1979;18(7):703-713.
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© ARVO (1962-2015); The Authors (2016-present)
We have developed an electronic spatial frequency sweep technique for electrophysiological assessment of visual acuity and pattern vision. The technique allows an accurate and reliable measurement of VEPs to a full range of spatial frequencies in just 10 sec. Because the measurements are so rapid, the technique suggests several new improvements in the assessment of visual function. Sweeping spatial frequency linearly and extrapolating the high-frequency region of the VEP spatial-tuning function to zero voltage allows an estimate of acuity which correlates highly with psychophysical estimates of acuity. Variants of the procedure are appropriate for the assessment of refracture error, determination of equality of visual function for the two eyes and of binocular interactions, and for sequential assessment of therapeutic conditions.
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