The key observation behind the measurement method and data analysis is that the normalized intensity (with respect to full-field illumination) at the center of a disk with radius
θ is equal to the radial integral of the PSF of the system between 0 and
θ.
17 Then, the PSF can be calculated from the derivative of the central intensity of the disks for each series with respect to
θ by using the following equation
17:
where
Display Formula is the central intensity of the recorded disk and
θ is the disk diameter. To avoid noise associated with numerical differentiation, an appropriate function was fitted to the experimental data (see below), and the derivative was evaluated analytically. The PSF was assumed to be rotationally symmetric, and the following formula was used to approximate its shape:
where
θo and
n are arbitrary constants and
α is a normalization coefficient (which depends on
θo and
n) so that the radial integral of the PSF is equal to unity. Similar generalizations of the Stiles-Holladay formula have been previously employed to approximate the PSF.
19,20 This function has the flexibility to approximate different values of the PSF at its most peripheral parts while
θo can be adjusted to match different widths of the central part of the PSF.
The radial integral of this function was used to fit the experimental data:
As experimental data on
Ic are recorded in arbitrary units, they are normalized in the fitting process so their range is between 0 and 1.
Figure 2 shows normalized data and fitted functions.
The double-pass PSF was reconstructed based on the estimated values of
θo and
n. This creates by definition (
Equation 2) a double-pass PSF that is radially normalized to unity.
The (single-pass) PSF was calculated numerically by considering that the double-pass PSF (
dpPSF) is the autocorrelation of the PSF.
where 𝓕 and 𝓕
−1 denote the two-dimensional discrete Fourier transform and its inverse, respectively. For each reconstructed PSF, the “straylight parameter”
PSF(θ) . θ 2 was calculated for 0.5° and 6° to quantify narrow- and wider-angle scattering, respectively.