May 2005
Volume 46, Issue 13
ARVO Annual Meeting Abstract  |   May 2005
Multi Wavelength Shack Hartmann Sensor
Author Affiliations & Notes
  • P. Jain
    Optical Sciences,
    University of Arizona, Tucson, AZ
  • J. Schwiegerling
    University of Arizona, Tucson, AZ
  • Footnotes
    Commercial Relationships  P. Jain, None; J. Schwiegerling, None.
  • Footnotes
    Support  Research to Prevent Blindness
Investigative Ophthalmology & Visual Science May 2005, Vol.46, 1183. doi:
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    • Get Citation

      P. Jain, J. Schwiegerling; Multi Wavelength Shack Hartmann Sensor . Invest. Ophthalmol. Vis. Sci. 2005;46(13):1183.

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      © ARVO (1962-2015); The Authors (2016-present)

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Abstract: : Purpose: To simultaneously measure wavefront aberrations at multiple wavelengths with a Shack Hartmann Wavefront sensor. This allows for measurement of both chromatic and monochromatic aberrations at the same time. Methods: Three visible Lasers (455 nm, 532 nm and 630 nm) coupled through a fiber are used as a source for the wavefront sensor. A color camera is used as a detector and Shack Hartmann sensor is used to measure the wavefront. Images from the wavefront sensor are broken into Red, Green and Blue channels and analyzed separately. Chromatic aberration is determined by the respective defocus of each channel. Higher order monochromatic aberrations are also measured with the same data. Results: Defocus levels for 455 nm, 532 nm and 630 nm were –1.0 diopter, –0.5 diopter and +0.2 diopter, respectively. These values are consistent with clinical measures of chromatic aberrations. Conclusions: The multiwavelength Shack Hartmann Sensor can reliably measure monochromatic and chromatic aberrations simultaneously.

Keywords: optical properties • refraction • refractive surgery: optical quality 

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