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JP Pascual, PA Sample, RN Weinreb; Spatial Relationship of Defects in Frequency Doubling Technology Perimetry and Standard Achromatic Perimetry . Invest. Ophthalmol. Vis. Sci. 2002;43(13):2138.
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Purpose: To determine the spatial overlap of defects in date-matched frequency doubling technology (FDT) and standard achromatic perimetry (SAP) Methods: We analyzed 305 date-matched test-pairs from 111 glaucoma patients and suspects (47 with 2 test-pairs, 45 with 3, and 19 with 4). FDT abnormality was defined as a cluster of ≷= 4 pattern deviation (PD) points at p<5% or ≷=1 PD point p<0.5% (Sponsel et al. AJO, 1998). SAP abnormality was defined as a Glaucoma Hemifield Test score outside normal limits or a corrected pattern standard deviation at p<5%. Fields from single test-pairs in 78 normals were used to assess specificity for these criteria. Thirty subjects had consecutive repeatedly abnormal test-pairs for both FDT and SAP. The first of these were analyzed further to determine the overlap and extent of quadrant and PD area defects. FDT quadrant defects were defined as ≷=2 PD points at p<5%. SAP defective quadrants were defined as ≷=3 PD points at p<5% or ≷=2 PD points at p<5% with 1 of those at p<1%. Overlap for PD plot area defects were defined as an FDT PD plot point at p<5% having at least one spatially-underlying SAP PD point at p<5%. Results: The specificity for the criteria chosen without requiring repeatability was equally high for both tests, 88.5% (69/78) for FDT and 91% (71/78) for SAP. Of the 78 normals, 63 had normal grades for both tests, 8 were abnormal in FDT only, 6 in SAP only, and 1 in both tests. Of the 81 patients without repeatable abnormality in both tests, 5 were repeatable in only FDT and 5 in only SAP. All 30 subjects with repeatable abnormality in both tests had at least 1 overlapping defective quadrant in both FDT and SAP. The numbers of defective quadrants were the same for 13, more in FDT for 8, and more in SAP for 9. All 30 subjects had at least 1 overlapping PD plot area across both tests. The numbers of PD plot area defects were the same for 3, greater in FDT for 16, and greater in SAP for 11. Conclusion: FDT and SAP are characterizing defects similarly by quadrant and test point location.
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