Abstract
Purpose :
Electrophysiology tests are used to assess visual functions and detect pathologies of the retina, optic nerve and visual pathways. The purpose of this study was to investigate the test-retest repeatability of two novel office-based electrophysiology platforms: Steady-state pattern electroretinogram (ssPERG) and Full-field electroretinogram (ffERG) in normal subjects.
Methods :
Subjects with normal eye examination were enrolled in this prospective study. Visual acuity testing, slit-lamp examination, and standard automated perimetry (Carl Zeiss Meditec Inc., Dublin, CA; 24-2 SITA Standard Strategy) were performed. The ssPERG (Diopsys Inc, Pine Brook, NJ; concentric stimulus fields - 16 and 24 degrees) and ffERG (Diopsys Inc, Pine Brook, NJ; flicker and white flash testing protocols) were applied to all subjects. Both tests were performed in a dark room without pupil dilation. Each eye was tested three times by the same operator. Test duration was approximately 30 seconds per eye, per test, with 1-minute rest time between sessions. Outcome measures were repeatability of ssPERG (magnitude and magnitudeD), flicker ffERG (magnitude and phase), and white-flash ffERG (latency, delta amplitude and a-wave). Within-session intra-class correlation coefficients (ICCs) were calculated for each testing parameter.
Results :
A total of 107 eyes from 47 subjects with normal eye examination were included in our analysis. The mean (±SD) age was 52.4 (±16.3) years and subjects were predominantly female (n=27, 57.4%). Table 1 shows the mean (SD) values for all tested parameters. The ICCs for ssPERG ranged between 0.65 and 0.79. The ICCs for ffERG flicker protocol ranged between 0.73 and 0.98, and for the ffERG white flash protocol between 0.86 and 0.95. Bland-Altman plots measuring the agreement between the first and second tests are shown in Figure 1.
Conclusions :
Test-retest repeatability of ssPERG and ffERG (flicker and white flash) using a novel office-based testing platform ranged between good to excellent for all tested parameters.
This is an abstract that was submitted for the 2016 ARVO Annual Meeting, held in Seattle, Wash., May 1-5, 2016.