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Stefan B Ploner
Pattern Recognition Lab, Friedrich-Alexander-Universitat Erlangen-Nurnberg, Erlangen, Bayern, Germany
Department of Electrical Engineering and Computer Science and Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, Massachusetts, United States
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Jungeun Won
Department of Electrical Engineering and Computer Science and Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, Massachusetts, United States
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Antonio Yaghy
Department of Ophthalmology, New England Eye Center, Boston, Massachusetts, United States
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Kenneth Lam
Department of Ophthalmology, New England Eye Center, Boston, Massachusetts, United States
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Jessica Girgis
Department of Ophthalmology, New England Eye Center, Boston, Massachusetts, United States
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Julia Schottenhamml
Pattern Recognition Lab, Friedrich-Alexander-Universitat Erlangen-Nurnberg, Erlangen, Bayern, Germany
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Lennart Husvogt
Pattern Recognition Lab, Friedrich-Alexander-Universitat Erlangen-Nurnberg, Erlangen, Bayern, Germany
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Nadia K Waheed
Department of Ophthalmology, New England Eye Center, Boston, Massachusetts, United States
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James G. Fujimoto
Department of Electrical Engineering and Computer Science and Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, Massachusetts, United States
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Andreas Maier
Pattern Recognition Lab, Friedrich-Alexander-Universitat Erlangen-Nurnberg, Erlangen, Bayern, Germany